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Lecture

Student Rapid method using deep learning with multi-focus microphotographs to measure submicrometric structures

Friday (26.06.2020)
09:50 - 10:10 Room 3
Part of:


Laser microscopes and X-ray inspection systems are commonly used for measuring dimensions of laser-processed objects. Nevertheless, both methods require some time for preprocessing and measurement, entailing high costs. We propose a simple, fast, and inexpensive method for measuring submicrometric structures using deep learning with multi-focus microphotographs taken by an optical microscope.

Speaker:
Riki Narukage
Kobe University
Additional Authors:
  • George Okada
    Kobe University
  • Prof. Dr. Hiroshi Kawaguchi
    Kobe University

Dateien

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