Student Rapid method using deep learning with multi-focus microphotographs to measure submicrometric structuresFriday (26.06.2020) 09:50 - 10:10 Room 3
Laser microscopes and X-ray inspection systems are commonly used for measuring dimensions of laser-processed objects. Nevertheless, both methods require some time for preprocessing and measurement, entailing high costs. We propose a simple, fast, and inexpensive method for measuring submicrometric structures using deep learning with multi-focus microphotographs taken by an optical microscope.
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